HOME„Melt Quality Control >Ultra-lightweight and compact ‚olten metal controlling device at furnace ( CE-meter ) / QCR-nano

Ultra-lightweight and compact ‚olten metal controlling device at furnace ( CE-meter )QCR-nano

  • Thermal analysis to obtain CE value, C%, and Si%
  • List of result of a measurement indication of the dayI
  • nitial charge calculation,recharge calculation, etc
  • Data saving and reviewing possible.

 

 

Comparison

 
Type QCR-nano QCR-1000 QCR-2000
Outside dimensions
(mm)
H160 × W190 × D53 H270 × W230 × D80 H350 × W310 × D80
Display monitor
(inch)
5.9 6.5 12
Weight
(kg)
1.5 3.0 5.5
Recording media SD CF CF

Display

List of measured data

Variation chart of primary crystal temperature and eutecitic temperature.

Variation chart of CE, C%, Si%

Specification [ Type : QCR-nano ]

Outside dimensions H160 × W190 × D53 mm
Display monitor 5.9 ƒCƒ“ƒ`
Weight 1.5 kg
Recording media
SD
Measurement range 50 - 2400°F (JIS-K)
Operation procedure Dedicated keyboard
Measuring Accuracy
  • CE@2.30`4.80@ ±0.05
  • C%@2.50`4.00@ ±0.03
  • Si%@0.05`3.50 @±0.06
Accompanied parts
  • Cup stand (cable length: 5m)
  • Pedestal

option

Please contact us for more details.

  • Printer
  • The monitor distribution outputiVGAj
  • Data communication of the result of a measurement
  • Wired thermometer add

Corresponding consumables

Related product

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